Surface and Interface Analysis Journal Citation Rate 2026
0142-2421
eISSN 1096-9918
Wiley
US
Q2 Quartile Established Impact Verified Publisher
About Surface and Interface Analysis
Surface and Interface Analysis (SIA) is a peer-reviewed academic journal covering Electron and X-Ray Spectroscopy Techniques and Ion-surface interactions and analysis, published by Wiley in US, catalogued under ISSN 0142-2421 (e-ISSN 1096-9918). As of 2026, it has a 2025 2-Year Citation Rate (OpenAlex) of 2.12 (Q2 quartile) — the average number of citations its recent articles received over a two-year window, computed from OpenAlex open citation data, not the Clarivate (JCR) Impact Factor. It operates a subscription model (APC ~$3350 USD). OpenAlex records 10,133 works and 191,951 citations, with an h-index of 140.
Surface and Interface Analysis Citation Rate 2026 — In Context
Surface and Interface Analysis has a 2025 2-Year Citation Rate (OpenAlex) of 2.12, placing it in the Q2 quartile within the Electron and X-Ray Spectroscopy Techniques research area. This is the average number of citations the journal's recent articles received over a two-year window, computed from OpenAlex open citation data — not the Clarivate (JCR) Journal Impact Factor.
Surface and Interface Analysis operates a subscription-based publishing model — readers access articles through institutional subscriptions or pay-per-view.
Researchers looking to publish in Surface and Interface Analysis should review the journal's submission tips and verify the latest indexing status against Scopus, DOAJ, and Web of Science using our indexing tracker. To compare Surface and Interface Analysis against similar journals in the field, use our journal comparison tool.
Submission Tips for Surface and Interface Analysis
- Budget $3350 for the Article Processing Charge. Check if your institution or funder covers OA fees.
- This journal covers Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis, Metal and Thin Film Mechanics. Ensure your manuscript aligns with these scope areas to avoid desk rejection.
How Surface and Interface … Compares
Compared against 30 journals in the same research areas.
| ISSN (Print) | 0142-2421 |
|---|---|
| ISSN (Online) | 1096-9918 |
| Publisher | Wiley |
| Country | United States |
| APC / Cost | $3350 USD |
In-depth profile & metrics
Surface and Interface Analysis is published by Wiley and based in United States. It runs on a subscription or hybrid model with an article-processing charge of USD 3350.
In our subject taxonomy, Surface and Interface Analysis is classified under Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis, Metal and Thin Film Mechanics and Semiconductor materials and devices.
Surface and Interface Analysis is indexed in OpenAlex. OpenAlex tracking provides an open, citable record of its output even where commercial indexing is absent.
Its most recent citation rate stands at 2.121.
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Frequently Asked Questions about Surface and Interface Analysis
Live Indexing Status
Updated April 2026Track real-time indexing metrics to ensure this journal meets your academic requirements.
Citation Rate
Historical Trend
Initial data points onlyCitation Rate by Year
| Year | Value | Source |
|---|---|---|
| 2025 | 2.121 | 2-Year Mean Citedness (OpenAlex) |
Metrics are sourced from OpenAlex, DOAJ and Scopus and reflect the latest data we hold. The headline figure is a 2-year citation rate (OpenAlex), not a Clarivate Impact Factor. Always verify against the journal's official site before relying on it. See our Methodology or report a correction.
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Metadata
Last updated: Apr 24, 2026
Updated by: openalex_bulk
OpenAlex ID: S114406758
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