Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Citation Rate 2026
1071-1023
eISSN 1520-8567
American Institute of Physics
US
About Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (JVSTBMNSPMP) is a peer-reviewed academic journal, published by American Institute of Physics in US, catalogued under ISSN 1071-1023 (e-ISSN 1520-8567). As of 2026, it has a 2025 2-Year Citation Rate (OpenAlex) of 0.00 — the average number of citations its recent articles received over a two-year window, computed from OpenAlex open citation data, not the Clarivate (JCR) Impact Factor. It operates a subscription model.
| ISSN (Print) | 1071-1023 |
|---|---|
| ISSN (Online) | 1520-8567 |
| Publisher | American Institute of Physics |
| Country | United States |
| APC / Cost | Inquire with Publisher |
In-depth profile & metrics
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena is published by American Institute of Physics and based in United States.
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena is indexed in OpenAlex. OpenAlex tracking provides an open, citable record of its output even where commercial indexing is absent.
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Live Indexing Status
Updated April 2026Track real-time indexing metrics to ensure this journal meets your academic requirements.
Citation Rate
Historical Trend
Initial data points onlyCitation Rate by Year
| Year | Value | Source |
|---|---|---|
| 2025 | 0.000 | 2-Year Mean Citedness (OpenAlex) |
Metrics are sourced from OpenAlex, DOAJ and Scopus and reflect the latest data we hold. The headline figure is a 2-year citation rate (OpenAlex), not a Clarivate Impact Factor. Always verify against the journal's official site before relying on it. See our Methodology or report a correction.
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Metadata
Last updated: Apr 24, 2026
Updated by: openalex_bulk
OpenAlex ID: S4210169477
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