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FB

F. R. Brotzen

Texas Instruments (United States) US

101

Publications

3,226

Citations

24

H-Index

40

i10-Index

0

2yr Mean Cite

-

Cite/Paper

Data combined from OpenAlex + Semantic Scholar. OA = OpenAlex S2 = Semantic Scholar

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Publication & Citation Trends

Most Cited Works

On the generality of the relationship among contact stiffness, contact area, and elastic modulus during indentation

George M. Pharr, W. C. Oliver, F. R. Brotzen

Journal of materials research/Pratt's guide to venture capital sources 1992

1,527

Mechanical testing of thin films

F. R. Brotzen

International Materials Reviews 1994

156

Effect of oxygen and hydrogen on mechanical properties of commercial purity titanium

M.L. Wasz, F. R. Brotzen, Rex B. McLellan, A. J. Griffin

International Materials Reviews 1996

154

Thermal conductivity of thin SiO2 films

F. R. Brotzen, Peter J. Loos, D.P. Brady

Thin Solid Films 1992

96

Elastic constants of niobium-molybdenum alloys in the temperature range −190 to +100°C

W. C. Hubbell, F. R. Brotzen

Journal of Applied Physics 1972

91

Publications

101 total

One senior , six sophomores returning Polk ' s inexperienced Owls gear up for Saturday debut

Katherine E. Brown, Paul Pfeiffer, C. Garside, C. Philpott, D. Huston - Unknown Venue, 2012

Cited by 0 Semantic Scholar

Linear Magnetoacoustic Birefringence in Dysprosium

K. Salama, P. Donoho, F. Brotzen - Unknown Venue, 2008

Cited by 0 Semantic Scholar

The Effects of Deformation on the Electrical G i c Resistivity of Molybdenum Single Crystals

L. D. Whitmire, F. Brotzen - Unknown Venue, 2005

Cited by 0 Semantic Scholar

iß RICE UNIVERSITY

P. Donoho, F. Brotzen, K. Salama - Unknown Venue, 2003

Cited by 26 Semantic Scholar

Electrostatic adhesion testing of thin metallic layers

M. Dubec, F. Brotzen, C. Dunn - Unknown Venue, 1999

Cited by 0 Semantic Scholar

Electrostatic adhesion testing of thin metallizations

D. Callahan, H. Yang, F. Brotzen, A. J. Griffin, C. Dunn - IEEE Electron Device Letters, 1998

Cited by 5 Semantic Scholar

Interface Effect on the Transverse Thermal Conductivity of SiO 2 Films Deposited on Silicon

W. Zhao, F. Brotzen, L. Hehn, P. J. Loos - Unknown Venue, 1998

Cited by 4 Semantic Scholar

Electrostatic adhesion testing of electronic metallizations

H. Yang, F. Brotzen, D. Callahan, C. Dunn - Unknown Venue, 1997

Cited by 6 Semantic Scholar

Electrostatic Adhesion Testing for the Evaluation of Metallization Adhesion

H. Yang, F. Brotzen, D. Callahan, C. Dunn - Unknown Venue, 1997

Cited by 0 Semantic Scholar

Effect of oxygen and hydrogen on mechanical properties of commercial purity titanium

M.L. Wasz, F. R. Brotzen, Rex B. McLellan, A. J. Griffin - International Materials Reviews, 1996

Cited by 154 OpenAlex

Research Topics

Metal and Thin Film Mechanics (19) Copper Interconnects and Reliability (14) Hydrogen embrittlement and corrosion behaviors in metals (10) Titanium Alloys Microstructure and Properties (10) Microstructure and mechanical properties (9)

Frequent Co-Authors

A.

A. J. Griffin

4 joint publications

PE

Peter J. Loos

3 joint publications

D.

D. L. Davidson

2 joint publications

GE

George M. Pharr

1 joint publication

W.

W. C. Oliver

1 joint publication

M.

M.L. Wasz

1 joint publication

Affiliations

Texas A&M University at Galveston

US 1977 - 1977

Universidade Federal de São Carlos

BR 1986 - 1986

California Maritime Academy

US 1977 - 1977

Rice Institute

US 1960 - 1955

Texas Instruments (United States)

US 2002 - 1992

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