Kathryn M. Neilson
0000-0003-1061-2919
Publication & Citation Trends
Publications
0 total
Nondestructive Atomic Defect Quantification of Two-Dimensional Materials and Devices.
Cited by 1
Semantic Scholar
Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors
Cited by 0
Semantic Scholar
Deep Learning to Automate Fitting and Parameter Extraction of 2D Transistors
Cited by 0
Semantic Scholar
First Comparative Thermal Evaluation of 2D Semiconductor vs. Silicon Nanosheet Transistors
Cited by 0
Semantic Scholar
Sub-Nanometer Equivalent Oxide Thickness and Threshold Voltage Control Enabled by Silicon Seed Layer on Monolayer MoS2 Transistors.
Cited by 23
Semantic Scholar
Achieving 1-nm-Scale Equivalent Oxide Thickness Top-Gate Dielectric on Monolayer Transition Metal Dichalcogenide Transistors With CMOS-Friendly Approaches
Cited by 0
Semantic Scholar
High-current p-type transistors from precursor-engineered synthetic monolayer WSe$_2$
Cited by 1
Semantic Scholar
Research Topics
2D Materials and Applications
(13)
Advancements in Semiconductor Devices and Circuit Design
(8)
Chalcogenide Semiconductor Thin Films
(8)
Phase-change materials and chalcogenides
(8)
Semiconductor materials and devices
(7)
Affiliations
Iowa State University
Ames National Laboratory
École Nationale des Greffes
Intel (United Kingdom)
Stanford University