G. K. Celler
0000-0001-7871-0684
Publication & Citation Trends
Publications
0 total
Fabrication of buried layers of β-SiC using ion beam synthesis
Cited by 0
Semantic Scholar
Ultrahigh sensitivity SIMS analysis of oxygen in silicon
Cited by 8
Semantic Scholar
Incorporation of oxygen in SiC implanted with hydrogen
Cited by 6
Semantic Scholar
Laser-solid interactions
Cited by 0
Semantic Scholar
Lithography and doping in strained Si towards atomically precise device fabrication
Cited by 12
Semantic Scholar
Heteroepitaxial growth on thin sheets and bulk material: exploring differences in strain relaxation via low-energy electron microscopy
Cited by 5
Semantic Scholar
Diffusion and impurity segregation in hydrogen-implanted silicon carbide
Cited by 31
Semantic Scholar
Nanosecond Pulsed Laser Processing of Ion Implanted Single Crystal Silicon Carbide Thin Layers OA
Cited by 3
Semantic Scholar
Optimization of H+ Implantation Parameters for Exfoliation of 4H-SiC Films OA
Cited by 7
Semantic Scholar
Research Topics
Semiconductor materials and devices
(83)
Silicon and Solar Cell Technologies
(72)
Thin-Film Transistor Technologies
(71)
Silicon Nanostructures and Photoluminescence
(57)
Advancements in Semiconductor Devices and Circuit Design
(53)
Affiliations
Rutgers, The State University of New Jersey
Soitec (France)
AT&T (United States)
Alcatel Lucent (Germany)
General Electric (United States)